Sprache: Englisch
Verlag: CreateSpace Independent Publishing Platform, 2014
ISBN 10: 1495220850 ISBN 13: 9781495220852
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Paperback. Zustand: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
Sprache: Englisch
Verlag: CreateSpace Independent Publishing Platform, 2014
ISBN 10: 1495220850 ISBN 13: 9781495220852
Anbieter: Better World Books: West, Reno, NV, USA
Zustand: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Soft cover. Zustand: Very Good. No Jacket. 1st Edition. Unread title with clean interior and uncracked spine. Some very faint rubbing to covers and slight bumping to corners.
Sprache: Englisch
Verlag: Texas A & M University Press, 2026
ISBN 10: 1648433685 ISBN 13: 9781648433689
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 25,54
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 176 pages. 7.01x0.79x10.00 inches. In Stock.
Sprache: Englisch
Verlag: Texas A & M University Press, 2026
ISBN 10: 1648433685 ISBN 13: 9781648433689
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 27,22
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 176 pages. 7.01x0.79x10.00 inches. In Stock.
Sprache: Englisch
Verlag: Texas A & M University Press, 2026
ISBN 10: 1648433685 ISBN 13: 9781648433689
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 27,22
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 176 pages. 7.01x0.79x10.00 inches. In Stock.
Anbieter: Sell Books, Elland, YORKS, Vereinigtes Königreich
EUR 56,73
Anzahl: 1 verfügbar
In den Warenkorbpaperback. Zustand: Acceptable. Stains to cover, page edges, and/or pages inside. Please see the condition note after this for details, if this is missing please consider Acceptable to mean poor quality that could include major staining, water damage, writing, missing dustjacket, etc etc. Our books are dispatched from a Yorkshire former cotton mill. We list via barcode/ISBN so please note that the images are stock images and may not be the exact copy you receive, furthermore the details about edition and year might not be accurate as many publishers reuse the same ISBN for multiple editions and as we simply scan a barcode or enter an ISBN we do not check the validity of the edition data when listing. If you're looking for an exact edition please don't order (at least not without checking with us first, although we don't always have time to check). We aim to dispatch prompty, the service used will depend on order value and book size. We can ship to most countries, see our shipping policies. Payment is via Abe only.
Verlag: Eros Comix, 1992
Anbieter: Jackson Street Booksellers, Omaha, NE, USA
Erstausgabe
Soft cover. Zustand: Near Fine. 1st Edition. Portfolio folder with ten loose leaf prints. Price sticker on front cover. IB.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,50
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,50
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Coupled Data Communication Techniques for High-Performance and Low-Power Computing | Ron Ho (u. a.) | Taschenbuch | Integrated Circuits and Systems | xvi | Englisch | 2012 | Springer | EAN 9781461426172 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
Sprache: Englisch
Verlag: Springer-Verlag New York Inc., 2012
ISBN 10: 1461426170 ISBN 13: 9781461426172
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 236,15
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 222 pages. 9.20x6.10x0.51 inches. In Stock.
Anbieter: RARE ORIENTAL BOOK CO., ABAA, ILAB, Aptos, CA, USA
[Osaka 1808, Osaka Shurin]. Brown stitched wrs., covers well rubbed, new title slip, back missing small portion, contents clean, solid, 18 x 25.5 cm., 2 volumes bound in one, [23+13 +2] double folded leaves, entirely woodblock printed.R A R E .*** A small but minor dark stain to upper margin corner of first few pages, text unaffected. Written in Chinese and Japanese Kambun, with the Furigana for Japanese to read, this work is written in a large characters, and quite clean. Covering the diagnosis and treatment of the disease known in Japan as Sekiri-byo. Again drawing on a long Chinese tradition as a resource, this work had its origins in China with pharmacop- ea and medicine formula. See G. E. Mestler: A GALAXY OF OLD JAPANESE MEDICAL BOOK for a solid background and historical details as well as bibliography on this subject.