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Zustand: Bueno. : Este libro proporciona una visión desde los conceptos básicos hasta el estado del arte del procesamiento CMOS y la caracterización eléctrica, incluyendo la integración de la fotónica basada en semiconductores del Grupo IV. Examina los retos y oportunidades que ofrecen los materiales más allá del silicio, incluyendo una mirada de cerca a los materiales de alta k y la puerta de metal, la ingeniería de la tensión, el material del canal y la movilidad, y los contactos. El enfoque clave del libro está en las caracterizaciones, el procesamiento de dispositivos y las mediciones eléctricas. EAN: 9780081021392 Tipo: Libros Categoría: Tecnología|Ciencias Título: CMOS Past, Present and Future Autor: Henry Radamson| Eddy Simoen| Jun Luo| Chao Zhao Editorial: Woodhead Publishing Idioma: en Páginas: 278 Formato: tapa blanda.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbPaperback. Zustand: Brand New. 1st edition. 182 pages. 8.75x6.00x0.50 inches. In Stock.
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Taschenbuch. Zustand: Neu. Monolithic Nanoscale Photonics - Electronics Integration in Silicon and Other Group IV Elements | Henry Radamson (u. a.) | Taschenbuch | Englisch | 2014 | Elsevier Science | EAN 9780124199750 | Verantwortliche Person für die EU: Zeitfracht Medien GmbH, Ferdinand-Jühlke-Str. 7, 99095 Erfurt, produktsicherheit[at]zeitfracht[dot]de | Anbieter: preigu.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbHardcover. Zustand: Brand New. 298 pages. 9.25x6.10x0.83 inches. In Stock.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
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In den WarenkorbZustand: New. pp. 250.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbPaperback. Zustand: Brand New. 278 pages. 9.00x6.00x0.83 inches. In Stock.
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Taschenbuch. Zustand: Neu. Analytical Methods and Instruments for Micro- and Nanomaterials | Henry H. Radamson (u. a.) | Taschenbuch | Lecture Notes in Nanoscale Science and Technology | xvi | Englisch | 2024 | Springer | EAN 9783031264368 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. CMOS Past, Present and Future | Henry Radamson (u. a.) | Taschenbuch | Englisch | Woodhead Publishing | EAN 9780081021392 | Verantwortliche Person für die EU: Zeitfracht Medien GmbH, Ferdinand-Jühlke-Str. 7, 99095 Erfurt, produktsicherheit[at]zeitfracht[dot]de | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerousexamples, mostly taken from the authors'fields of research; semiconductor materials, metals and oxides.The book serves as a valuable guide for scientists and students working in materials science, physics,and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerousexamples, mostly taken from the authors'fields of research; semiconductor materials, metals and oxides.The book serves as a valuable guide for scientists and students working in materials science, physics,and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.