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Hardcover. Zustand: Fair. With dust jacket. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.

Zustand: good. Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the average WORN book or dust jacket that has all the pages present.

siehe Artikelbeschreibung. Zustand: siehe Artikelbeschreibung. ; geb. A.; OKart; OU; 350 S.; Zustand: Einband und OU gut; Schnitt Oberkante etwas fleckig; S. 45 - 55 dünne Bleistift - Striche; sonst gut und unbenutzt; kein Besitzvermerk,

Zustand: acceptable. Ausreichend/Acceptable: Exemplar mit vollständigem Text und sämtlichen Abbildungen oder Karten. Schmutztitel oder Vorsatz können fehlen. Einband bzw. Schutzumschlag weisen unter Umständen starke Gebrauchsspuren auf. / Describes a book or dust jacket that has the complete text pages (including those with maps or plates) but may lack endpapers, half-title, etc. (which must be noted). Binding, dust jacket (if any), etc may also be worn.

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Zustand: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Broschürt. Obr., 63s-., in gutem Zustand, [SAP54]. Deutsch 400g.

Broschürt. Obr.,63s., in gutem Zustand. [SAP136]. Deutsch 400g.

Zustand: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Gebunden. Oln, OU.,350s., in gutem Zustand, . [MSA12,6]. Deutsch 700g.

8°, Hardcover. Zustand: Gut. 350 S., Gebundenes Buch mit Original-Schutzumschlag. Das Buch ist in gutem, sauberen Zustand. Wir senden umgehend mit beiliegender MwSt.Rechnung. Sprache: Deutsch Gewicht in Gramm: 545.

350 Seiten Zustand: Der Schutzumschlag hat minimale Gebrauchsspuren. Das Buch hat keine Beschädigungen, einzelne Anstreichungen im Text. Rücken, Ecken, Kanten gut. Sprache: Deutsch Gewicht in Gramm: 560 Hardcover, kartoniert mit Schutzumschlag.

Hardcover. Zustand: Fair. No Jacket. 1st Edition. Condition : Fair - a usable study copy. Former-university library copy with associated library stamps etc. Hard cover , no jacket. 227pp. No highlighting or annotations to text. Covered in a library laminate. PAGE CREASING. Photos on request.

Zustand: Gut. Formateinband: Taschenbuch 357 S. Überarbeitete und aktualisierte Neuausgabe; Rücken etwas lesefaltig, kleine Knickspur am Vorderdeckel; sonst in gutem Zustand. Sprache: Deutsch Gewicht in Gramm: 350 [Stichwörter: Erforschung der Kristallstrukturen, Nutzung in der Mikroelektronik].

63 S., broschiert ; Reihe: Carl-Friedrich-von-Siemens-Stiftung: Themen, Band 21 ; Vortrag, gehalten an dem Mentorenabend der Carl-Friedrich-von-Siemens-Stiftung in München-Nymphenburg am 4. November 1974 ; mit 6 Illustrationen und graphische Darstellungen ; 21 cm ; sehr guter Zustand, keine Gebrauchsspuren, keine Mängel ;

Zustand: New. In.

Hardcover. Zustand: Good. No Jacket. 426 p; 270 Fig; Library-Stamp on Title-page, else good.

Hardcover. Zustand: Good. No Jacket. 310 p; 179 Fig, Library-Stamp at Title-Page, else good.

Hardcover. Zustand: Good. No Jacket. 396 p; 199 Fig, Library-Stamp on Title-page, else good.

Paperback. Zustand: Brand New. reprint edition. 130 pages. 9.25x6.10x0.32 inches. In Stock.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The aim of this book is twofold: it is intended for use as a textbook for a ~ourse on electronic materials (indeed, it stems from a series of lectures on this topic delivered at Milan Polytechnic and at the universities of Modena and Parma), and as an up-to-date review for scientists working in the field ::f silicon processing. Although a number of works on silicon are already available, the vast amount of existing and new data on silicon properties are nowhere adequately summarized in a single comprehensive report. The present volume is intended to fill this gap. Most of the examples dealt with are taken from the authors' every day experience, this choice being dictated merely by their greater knowl edge of these areas. Certain aspects of the physics of silicon have not been included; this is either because they have been treated in standard textbooks (e.g. the inhomogeneously doped semiconductor and the chem istry of isotropic or preferential aqueous etching of silicon), or because they are still in a rapidly evolving phase (e.g. silicon band-gap engineering, generation-recombination phenomena, cryogenic properties and the chem istry of plasma etching). In line with the standard practice in microelectronics, CGS units will be used for mechanical and thermal quantities, and SI units for electrical quan tities. All atomic energies will be given in electronvolts and the angstrom will be the unit of length used for atomic phenomena.

Paperback. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Zustand: New.

Zustand: New.

Zustand: New. In.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Point Defects in Semiconductors and Insulators | Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions | Johann-Martin Spaeth (u. a.) | Taschenbuch | xi | Englisch | 2012 | Springer Berlin | EAN 9783642627224 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 562 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.