Pradhan dhiraj (46 Ergebnisse)

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. pp. 359.

PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New. In English.

PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9781441950338.

Zustand: New. In English.

Zustand: New. In English.

Zustand: Used. pp. xi + 276 Illus.

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.…

Unknown. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Used. pp. 352 132 Illus. (51 Col.).

Zustand: Used. pp. 352.

Paperback. Zustand: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.

Zustand: New. In English.

Paperback. Zustand: Brand New. 359 pages. 9.21x6.14x0.87 inches. In Stock.

Taschenbuch. Zustand: Neu. On-Line Testing for VLSI | Michael Nicolaidis (u. a.) | Taschenbuch | Frontiers in Electronic Testing | iv | Englisch | 2010 | Springer | EAN 9781441950338 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Zustand: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.…

Zustand: New. In English.

Zustand: New. pp. 332.

Zustand: New.

Gebunden. Zustand: New.

Zustand: New. In English.

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.…