nan lin wang (10 Ergebnisse)

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1300grams, ISBN:9781402080036.

Zustand: New. pp. xx + 742 Illus.

Gebunden. Zustand: New. Nan Lin Wang, Hideo HosonoFrom fundamental physics point of view, iron-based superconductors have properties that are more amenable to band structural calculations. This book reviews the progress made in this fascinating field. With contributions fro.

Zustand: New. In.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 768 | Sprache: Englisch | Produktart: Bücher | Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

hardcover. Zustand: Gut. 562 Seiten; 9789814303224.3 Gewicht in Gramm: 1.

Buch. Zustand: Neu. Neuware - From fundamental physics point of view, iron-based superconductors have properties that are more amenable to band structural calculations. This book reviews the progress made in this fascinating field. With contributions from leading experts, the book provides a guide to understanding materials, physical properties, and superconductivity mechanism aspects, and is important for students and beginners to have an overall view of the recent progress in this active field.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Hardcover. Zustand: Brand New. 1st edition. 731 pages. 9.25x6.25x1.50 inches. In Stock.

Paperback. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.