Sprache: Englisch
Verlag: Intl Thomson Business Pr (edition ), 1993
ISBN 10: 0415059445 ISBN 13: 9780415059442
Anbieter: BooksRun, Philadelphia, PA, USA
Misc. Supplies. Zustand: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Sprache: Englisch
Verlag: Stockholm International Peace Research Instit, 1996
ISBN 10: 0198291965 ISBN 13: 9780198291961
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Paperback. Zustand: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 19,47
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In den WarenkorbZustand: New. In.
Taschenbuch. Zustand: Gut. 384 Seiten ex Library Book aus einer wissenschaftlichen Bibliothek Sprache: Englisch Gewicht in Gramm: 469.
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EUR 24,38
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In den WarenkorbZustand: New. KlappentextrnrnThe purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices.
Sprache: Englisch
Verlag: British Library, Historical Print Editions Nov 2012, 2012
ISBN 10: 1288327676 ISBN 13: 9781288327676
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Neuware - The purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices in ROC theory were adapted to act as controllable factors. In this research a simple virtual battlespace representation is employed. The experimental results of the CID system are summarized by a posterior confusion matrix and throughout the confusion matrix analysis we can obtain all various types of data such as accuracy, error cost, error rates, and so forth. To find the optimal parameters three evaluation techniques were applied: (1) Linearly constrained discrete optimization, (2) Taguchi's SN ratio method and (3) Robust parameter design with a combined array. The results are compared and contrasted across different objective functions.
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 94,57
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In den WarenkorbPaperback. Zustand: Brand New. 1st edition. 176 pages. 8.75x5.50x0.75 inches. In Stock.
Anbieter: Phatpocket Limited, Waltham Abbey, HERTS, Vereinigtes Königreich
EUR 105,97
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In den WarenkorbZustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
EUR 122,05
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Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbZustand: New. In.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: ¿ the economic impact of employing the microelectronics fabricated by in dustry, ¿ a study of the relationship between reliability and yield, ¿ the progression toward miniaturization and higher reliability, and ¿ the correctness and complexity of new system designs, which include a very significant portion of software.
EUR 180,10
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In den WarenkorbZustand: New.