Kim taeho (18 Ergebnisse)
Sprache: Englisch
Verlag: Stockholm International Peace Research Instit, 1996
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Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
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Zustand: New. KlappentextrnrnThe purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices.
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Sprache: Englisch
Verlag: British Library, Historical Print Editions Nov 2012, 2012
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Taschenbuch. Zustand: Neu. Neuware - The purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices in ROC theory were adapted to act as controllable factors. In…this research a simple virtual battlespace representation is employed. The experimental results of the CID system are summarized by a posterior confusion matrix and throughout the confusion matrix analysis we can obtain all various types of data such as accuracy, error cost, error rates, and so forth. To find the optimal parameters three evaluation techniques were applied: (1) Linearly constrained discrete optimization, (2) Taguchi's SN ratio method and (3) Robust parameter design with a combined array. The results are compared and contrasted across different objective functions.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Engineering Mathematics with MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
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Paperback. Zustand: Brand New. 1st edition. 176 pages. 8.75x5.50x0.75 inches. In Stock.
Engineering Mathematics with MATLAB
Yang, Won Y. Won Y. Yang, Young K. Choi, Jaekwon Kim, Man Cheol Kim, H. Jin Kim, Taeho Im,
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Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
Engineering Mathematics with MATLAB
Yang, Won Y. Won Y. Yang, Young K. Choi, Jaekwon Kim, Man Cheol Kim, H. Jin Kim, Taeho Im,
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ENGINEERING MATHEMATICS WITH MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
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Electronic Circuits with MATLAB, PSpice, and Smith Chart
Yang, Won Y.; Kim, Jaekwon; Park, Kyung W.; Baek, Donghyun; Lim, Sungjoon; Joung, Jingon; Park, Suhyun; Lee, Han L.; Choi, Woo June; Im, Taeho
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Applied Numerical Methods Using MATLAB
Yang, Won Y.; Cao, Wenwu; Kim, Jaekwon; Park, Kyung W.; Park, Ho-Hyun; Joung, Jingon; Ro, Jong-Suk; Lee, Han L.; Hong, Cheol-Ho; Im, Taeho
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenanc…e systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: - the economic impact of employing the microelectronics fabricated by in dustry, - a study of the relationship between reliability and yield, - the progression toward miniaturization and higher reliability, and - the correctness and complexity of new system designs, which include a very significant portion of software.
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Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operatio…n and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: ¿ the economic impact of employing the microelectronics fabricated by in dustry, ¿ a study of the relationship between reliability and yield, ¿ the progression toward miniaturization and higher reliability, and ¿ the correctness and complexity of new system designs, which include a very significant portion of software.
