E todd ryan (7 Ergebnisse)

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Falcone, R: CREEPY CAMPFIRE QUARTERLY
Coplin, James E.; Falcone, Ryan Neil; Cort, Jim; Glaser, Dale W.; Obermeyer, Fredrick; Stolliker, Ambrose; Todd, Jeffrey; Nafpliotis, Nick; Hivner, Christopher; Lamb, Lisamarie
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Zustand: New. In English.

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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In 2004, the microelectronics industry quietly ushered in the Nanoelectronics Era with the mass production of sub-100nm node devices. The current leading-edge semiconductor chips in mass production - the so-called 90nm node devices - have a transistor gate length of less than 50nm. This rapid technological advancement in the semiconductor industry has been made possible by innovations in materials employed in both transistor fabrication (front-end-of-the-line, FEOL) and interconnect fabrication (back-end-of-the-line, BEOL). The 90nm node BEOL features copper (Cu) interconnects and dielectric materials with a low-dielectric constant (k) of about 3.0. However, for the next generations of 65nm node and beyond, evolutionary and revolutionary innovations in BEOL materials and processes are needed to fuel the continued, healthy growth of the semiconductor. This book provides a forum to exchange advances in materials, processes, integration, and reliability in advanced interconnects and packaging. The book also addresses interconnects for emerging technologies, including 3D chip stacking and optical interconnects, as well as interconnects for optoelectronics, plastic electronics and molecular electronics.…

Sprache: Englisch
Verlag: Iconoclast / D.A.P. Distributed Art Publishers, Inc. New York, NY, 2004
- Hardcover
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256 pp.; 28.5 x 22.2 cm.; sewn bound; black-and-white & color; edition size unknown; unsigned and unnumbered; offset-printed Exhibition catalogue published in conjunction with show held at Contemporary Arts Center, Cincinnati, March 13 - May 23, 2004. Traveled to Yerba Buena Center for the Arts, San Francisco, CA, July 17 - October 3, 2004. Traveled to the Orange County Museum of Art, Newport Beach, CA, February 5 - May 8, 2005. Exhibition organized and catalogue edited by Aaron Rose and Christian Strike. Essays by Aaron Rose, Christian Strike, Alex Baker, Thom Collins, Jeffrey Deitch, Carlo McCormick, Arty Nelson, James E. Walmesley, and Jocko Weyland. Artists include Thomas Campbell, Cynthia Connolly, Brian Donnelly, Cheryl Dunn, Shepard Fairey, Phil Frost, Mark Gonzales, Evan Hecox, Jo Jackson, Todd James (REAS), James Jarvis, Andy Jenkins, Chris Johanson, Spike Jonze, Margaret Kilgallen, Harmony Korine, Geoff McFetridge, Barry McGee, Ryan McGinley, Ryan McGuinness, Mike Mills, Stephen Powers (ESPO), Terry Richardson, Clare E. Rojas, Rostarr, Ed Templeton, and Tobin Yelland. Includes full page artists' pages on Raymond Pettibon, Clare E. Rojas, Jo Jackson, Craig R. Stecyk III, Chris Johanson, Thomas Campbell, Ed Templeton, and Barry McGee. Includes biographies of artists as well as of artists identified as roots and influencers including Jean-Michel Basquiat, Neil Blender, Henry Chalfant, Larry Clark, R. Crumb, Glen E. Friedman, Futura, Keith Haring, Wes Humpston, Ari Marcopoulos, Raymond Pettibon, Pushead, Craig R. Stecyk III, and Andy Warhol. Also includes contributor biographies. Very Good / Fine. Small bump to bottom right corner of publication and right side of recto. Light dusting of dust jackets. Contents clean and unmarked. Due to large size and weight additional shipping charges will be required for international orders.…