Drost robert (21 Ergebnisse)

hardcover. Zustand: Good. Ex-library book with stickers and/or stamps throughout.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. Schutzumschlag mit Kratzer und Einriss, sonst gut.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.

Original-Leinenband mit Schutzumschlag, 8°, 347 Seiten. Schutzumschlag verblasst sonst guter Zustand.

Zustand: New.

Zustand: New. In English.

Zustand: New. In English.

Zustand: As New. Unread book in perfect condition.

Hardback. Zustand: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Taschenbuch. Zustand: Neu. Coupled Data Communication Techniques for High-Performance and Low-Power Computing | Ron Ho (u. a.) | Taschenbuch | Integrated Circuits and Systems | xvi | Englisch | 2012 | Springer | EAN 9781461426172 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Paperback. Zustand: Brand New. 222 pages. 9.20x6.10x0.51 inches. In Stock.

Hardback. Zustand: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Original Leinenband mit Schutzumschlag, Gr.-4, 290 Seiten Guter Zustand.

Softcover. Zustand: Sehr gut. 1. Auflage. M : 290 Seiten, 304 Abb. - Anhand von beispielhaft präsentierten Werken prominenter Vertreter des Surrealismus, neben Salvador Dalí, Max Ernst und Joan Miró auch René Magritte, Yves Tanguy oder Meret Oppenheim, werden charakteristische Wirkweisen und Strategien des Surrealismus erfahrbar. Nicht nur zeitgenössische Künstler finden darin Quellen der Inspiration und aktuelle Bezüge.…

Befriedigend Leder Sehr gut. Hier Band IV. Klarsicht Schutzumschlag, kleiner Riss am Kapital. Ledereinband, montiertes Rückenschildchen, Lesebändchen, TADELLOS. Inhalt: NOUVELLES FLEURS DU MAL, NEUE BLUMEN DES BÖSEN. MATERIALEN. Erschienen 1975. 350 paginierte Seiten. Zustand WIE NEU. +++ 13 x 21,5 cm, 0,7 kg. +++ Stichwörter: Poesie Fin de siècle Essays Französische Literatur Bibliophilie Gewicht in Gramm: 700.…

Befriedigend Leder Wie neu. Hier Band III. Klarsicht Schutzumschlag, kleiner Riss am Kapital. Ledereinband, montiertes Rückenschildchen, Lesebändchen, TADELLOS. Inhalt: LES FLEURS DU MAL, DIE BLUMEN DES BÖSEN. Erschienen 1975. 442 paginierte Seiten. Zustand WIE NEU. +++ 13 x 21,5 cm, 0,7 kg. +++ Stichwörter: Poesie Fin de siècle Essays Französische Literatur Bibliophilie Gewicht in Gramm: 700.…

Orig.-Leder mit Folienumschlag. Zustand: Gut. 463 S. 9783446133280 krankheitsbedingt erfolgt der Versand nur 1x pro Woche. Sprache: Deutsch Gewicht in Gramm: 550.

Zustand: gut. 1983. Baudelaire, Charles: Sämtliche Werke, Briefe; Teil: Bd. 2., Vom Sozialismus zum Supranaturalismus, Edgar Allan Poe : 1847 - 1857. [Übers. von Guido Meister . Kommentare von Friedhelm Kemp u. Wolfgang Drost] In deutscher Sprache. pages.