director stephen w (18 Ergebnisse)

Hardcover. Zustand: Fair. No Jacket. Missing dust jacket; Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Zustand: Bueno. : Este libro trata sobre el diseño VLSI para la fabricación y la mejora del rendimiento. Cubre temas de ingeniería de sistemas e ingeniería informática. Es un recurso en línea que también está disponible en forma impresa. El libro forma parte de 'The Kluwer International Series in Engineering and Computer Science'. EAN: 9781461288169 Tipo: Libros Categoría: Tecnología|Ciencias Título: VLSI Design for Manufacturing: Yield Enhancement Autor: Stephen W. Director| Wojciech Maly| Andrzej J. Strojwas Editorial: Springer US Idioma: en Páginas: 308.

Vintage studio still photograph from the 1965 film. Dave McCloud (Rod Cameron) sees Judge Irving Short (Tim McCoy) ambushed and killed and takes on the Judge's identity to avenge his murder from the town's bandits, led by Red Zimmer (Stephen McNally). 8 x 10 inches. Very Good, some creasing and small closed tear at the bottom margin. Pitts 3365.

Bibl.Ex., keine Markierungen-Unterstreichungen-Anmerkungen im Text, Format groß 8°, 202Seiten, Hardcover, sehr gut erhalten, Lieferung gegen Vorkasse. Shipping to abroad insured with tracking number.

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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes a new type of computer aided VLSI design tool, called a VLSI System Planning, that is meant to aid designers dur ing the early, or conceptual, state of design. During this stage of design, the objective is to define a general design plan, or approach, that is likely to result in an efficient implementation satisfying the initial specifications, or to determine that the initial specifications are not realizable. A design plan is a collection of high level design decisions. As an example, the conceptual design of digital filters involves choosing the type of algorithm to implement (e. g. , finite impulse response or infinite impulse response), the type of polyno mial approximation (e. g. , Equiripple or Chebyshev), the fabrication technology (e. g. , CMOS or BiCMOS), and so on. Once a particu lar design plan is chosen, the detailed design phase can begin. It is during this phase that various synthesis, simulation, layout, and test activities occur to refine the conceptual design, gradually filling more detail until the design is finally realized. The principal advantage of VLSI System Planning is that the increasingly expensive resources of the detailed design process are more efficiently managed. Costly redesigns are minimized because the detailed design process is guided by a more credible, consistent, and correct design plan.

Gebunden. Zustand: New.

Gebunden. Zustand: New. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

Zustand: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 292 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 609. . 1989. Hardback. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

Post-production Continuity and Dialogue script for the 1951 film. A group of new recruits arrive at an Air Force training camp and experience the usual growing pains: hazing, romance, and rivalry. An early appearance by Golden Age heartthrob Rock Hudson as an aggressive upperclassman. Shot on location in Arizona, Florida, and Texas. White titled self wrappers, noted as CONTINUITY & DIALOGUE on the front wrapper, noted as production No. 1653, dated JANUARY 31, 1951, with credits for actors Stephen McNally, Gail Russell, Alex Nicol, and other cast members. Title page integral with the front wrapper, as issued. 136 leaves, with last page of text numbered REEL TEN PAGE 13. Mimeograph duplication, rectos only. Pages Near Fine, wrapper Very Good plus, with some fading to the top, left, and right edges, bound with two gold brads.

Kluwer, Boston, 1990. XII, 291 pages with some graphics, hardcover, (former library book)--- 750 Gramm.

Treatment script for the 1951 film. Copy belonging to Universal-International film executive Leo Spitz, with his name in manuscript ink on the front wrapper. A group of new recruits arrive at an Air Force training camp and experience the usual growing pains: hazing, romance, and rivalry. An early appearance by Golden Age heartthrob Rock Hudson as an aggressive upperclassman. Shot on location in Arizona, Florida, and Texas. Blue titled wrappers, noted as TREATMENT on the front wrapper, rubber-stamped production No. 7718, dated March 21, 1950. Title page present, noted as Treatment, with credits for screenwriter Robert W. Soderberg. 78 leaves, with last page of text numbered 77. Mimeograph duplication on yellow stock, rectos only, with yellow revision pages throughout, dated variously between 3/16/50 and 3/18/50. Pages Near Fine, wrapper Very Good plus, bound at the top left corner with one gold brad.