Debashis bhattacharya (20 Ergebnisse)

Paperback. Zustand: Brand New. 116 pages. 0.47x9.02x5.98 inches. In Stock.

Zustand: New. 2015. paperback. . . . . . Books ship from the US and Ireland.

Hardcover. Zustand: Brand New. 116 pages. 6.00x0.31x9.00 inches. In Stock.

Zustand: New.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. 2015. hardcover. . . . . . Books ship from the US and Ireland.

Zustand: New. pp. 352 209 Illus.

Gebunden. Zustand: New. KlappentextToday, nutraceuticals have been recognized as any natural product, food or dietary supplement that provides medical or health benefits including the prevention of diseases. Keeping these aspects in view, the book covers differ.

Zustand: New. In English.

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Zustand: Used. pp. 480 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Zustand: Used. pp. 480.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.…

Zustand: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 160 pages, biography. BIC Classification: T; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 940. . 1989. Hardback. . . . . Books ship from the US and Ireland. …

Kluwer, Boston, 1990. X, 159 pages with some graphics, hard cover----former library book in good condition- 460 Gramm.

Zustand: New. In English.

Zustand: New. In English.

Hardcover. Zustand: Brand New. 2009 edition. 458 pages. 9.00x6.00x0.75 inches. In Stock.

Zustand: New. In English.

Zustand: New. In English.