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Hardcover. Zustand: Brand New. 204 pages. 9.25x6.10x0.71 inches. In Stock.

Taschenbuch. Zustand: Neu. Parasitic Substrate Coupling in High Voltage Integrated Circuits | Minority and Majority Carriers Propagation in Semiconductor Substrate | Pietro Buccella (u. a.) | Taschenbuch | Analog Circuits and Signal Processing | xvii | Englisch | 2019 | Springer | EAN 9783030089764 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools.The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching devices besides sensitive control, protection and signal processing circuits.The injection of parasitic charges leads to the activation of substrate bipolar transistors. This book explores how these events can be evaluated for a wide range of circuit topologies. To this purpose, new generalized devices implemented in Verilog-A are used to model the substrate with standard circuit simulators. This approach was able to predict for the first time the activation of a latch-up in real circuits through post-layout SPICE simulation analysis.Discusses substrate modeling and circuit-level simulation of parasitic bipolar device coupling effects in integrated circuits;Includes circuit back-annotation of the parasitic lateral n-p-n and vertical p-n-p bipolar transistors in the substrate;Uses Spice for simulation and characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices;Offers design guidelines to reduce couplings by adding specific protections.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools.The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching devices besides sensitive control, protection and signal processing circuits.The injection of parasitic charges leads to the activation of substrate bipolar transistors. This book explores how these events can be evaluated for a wide range of circuit topologies. To this purpose, new generalized devices implemented in Verilog-A are used to model the substrate with standard circuit simulators. This approach was able to predict for the first time the activation of a latch-up in real circuits through post-layout SPICE simulation analysis.Discusses substrate modeling and circuit-level simulation of parasitic bipolar device coupling effects in integrated circuits;Includes circuit back-annotation of the parasitic lateral n-p-n and vertical p-n-p bipolar transistors in the substrate;Uses Spice for simulation and characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices;Offers design guidelines to reduce couplings by adding specific protections.

Taschenbuch. Zustand: Neu. Neuware - Un viaggio attraverso la storia di Vigevano e dei suoi dintorni, con un'attenzione particolare alla cultura, ai monumenti e alle tradizioni locali.

hardcover. Zustand: Good. Cm. 29, pp. xv (1) 292. Legatura coeva in mezza pelle, dorso liscio con titoli e filetti in oro. Esemplare con qualche segno d'uso al dorso e bruniture più marcate ad un paio di quaderni dovute al tipo di carta, peraltro assai genuino e marginoso, in barbe. Edizione originale di quest'opera edita per cura del fratello dell'autore dopo la morte di quest'ultimo. Cfr. Lozzi (II, 6439). . Book.

Buch. Zustand: Neu. Neuware.