Studying Atomic Dynamics with Coherent X-rays
Michael Leitner
Verkauft von buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
AbeBooks-Verkäufer seit 23. Januar 2017
Neu - Hardcover
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In den Warenkorb legenVerkauft von buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
AbeBooks-Verkäufer seit 23. Januar 2017
Zustand: Neu
Anzahl: 2 verfügbar
In den Warenkorb legenNeuware -Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy.The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 108 pp. Englisch.
Bestandsnummer des Verkäufers 9783642241208
Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.
Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy.
The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.
Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.
Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy.
The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.
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