Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Lessons from Nanoscience: a Lecture Note Series, Band 4) - Softcover

Buch 4 von 9: Lessons From Nanoscience: A Lecture Notes

Reifenberger, Ronald G

 
9789814630351: Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Lessons from Nanoscience: a Lecture Note Series, Band 4)
Softcover
ISBN 10: 9814630357 ISBN 13: 9789814630351
Verlag: Wspc, 2015

Inhaltsangabe

"The overall structure of the book is excellent. It gives a good description of supplementary information needed for the average graduate student to understand the physics of Atomic Force Microscopy." Mrs Bulletin The atomic force microscope (Afm) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an Afm. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an Afm. Useful as a study guide to “Fundamentals of Afm”, an online video course available at https://nanohub.org/courses/Afm1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in Afm (with the combination of book and online videos)

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Von der hinteren Coverseite

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

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Verlag
Wspc
Erscheinungsdatum
2015
Sprache
Englisch
ISBN 10 
9814630357
ISBN 13 
9789814630351
Einband
Taschenbuch
Anzahl der Seiten
340
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
gpsr@libri.de
gpsr@libri.de

Friedensallee 273
Hamburg
22763
Deutschland

Weitere beliebte Ausgaben desselben Titels

9789814630344: FUNDAM ATOM FORCE MICROSC (P1): Part I: Foundations (Lessons from Nanoscience: a Lecture Note Series, Band 4)

Vorgestellte Ausgabe

ISBN 10:  9814630349 ISBN 13:  9789814630344
Verlag: World Scientific, 2015
Hardcover