Verwandte Artikel zu Thermal Reliability of Power Semiconductor Device in...
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (CPSS Power Electronics Series) - Hardcover
Inhaltsangabe
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
Xiong Du obtained his B.S., M.S., and Ph. D. degrees from Chongqing University, China in 2000, 2002, and 2005 respectively, all in the Electrical Engineering. He has been with Chongqing University since 2002 and is currently a full professor in the School of Electrical Engineering, Chongqing University. He was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY from July 2007 to July 2008. His research interests include power electronics system reliability and stability. He is a recipient of the National Excellent Doctoral Dissertation of P.R. China in 2008.
Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.
Von der hinteren Coverseite
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
- VerlagSpringer-Verlag GmbH
- Erscheinungsdatum2022
- ISBN 10 9811931313
- ISBN 13 9789811931314
- EinbandTapa dura
- SpracheEnglisch
- Auflage1
- Anzahl der Seiten172
- Kontakt zum HerstellerNicht verfügbar
Neu kaufen
Diesen Artikel anzeigen
EUR 164,49
Gratis für den Versand innerhalb von/der Deutschland
Versandziele, Kosten & Dauer
Suchergebnisse für Thermal Reliability of Power Semiconductor Device in...
Beispielbild für diese ISBN
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Verlag:
Springer Nature Singapore, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Gebraucht
Hardcover
Anbieter: Buchpark, Trebbin, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Zustand: Hervorragend. Zustand: Hervorragend | Seiten: 188 | Sprache: Englisch | Produktart: Bücher. Artikel-Nr. 39028957/1
Anzahl: 1 verfügbar
Foto des Verkäufers
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Verlag:
Springer Nature Singapore, Springer Nature Singapore, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Neu
Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. Artikel-Nr. 9789811931314
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Brand New. 188 pages. 9.25x6.10x0.63 inches. In Stock. Artikel-Nr. x-9811931313
Anzahl: 2 verfügbar