Controlling the aging of power transistors: Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions - Softcover

Inhaltsangabe

This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.