Verwandte Artikel zu Atomic Force Microscopy Based Nanorobotics: Modelling,...

Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments: 71 (Springer Tracts in Advanced Robotics) - Softcover

 
9783642445019: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments: 71 (Springer Tracts in Advanced Robotics)

Inhaltsangabe

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Von der hinteren Coverseite

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.

Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Gratis für den Versand innerhalb von/der Deutschland

Versandziele, Kosten & Dauer

Weitere beliebte Ausgaben desselben Titels

9783642203282: Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments: 71 (Springer Tracts in Advanced Robotics)

Vorgestellte Ausgabe

ISBN 10:  3642203280 ISBN 13:  9783642203282
Verlag: Springer, 2011
Hardcover

Suchergebnisse für Atomic Force Microscopy Based Nanorobotics: Modelling,...

Foto des Verkäufers

Hui Xie
ISBN 10: 3642445012 ISBN 13: 9783642445019
Neu Taschenbuch

Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy. Artikel-Nr. 9783642445019

Verkäufer kontaktieren

Neu kaufen

EUR 160,49
Währung umrechnen
Versand: Gratis
Innerhalb Deutschlands
Versandziele, Kosten & Dauer

Anzahl: 1 verfügbar

In den Warenkorb

Beispielbild für diese ISBN

Xie, Hui; Onal, Cagdas; Régnier, Stéphane; Sitti, Metin
Verlag: Springer, 2014
ISBN 10: 3642445012 ISBN 13: 9783642445019
Neu Softcover

Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Zustand: New. In. Artikel-Nr. ria9783642445019_new

Verkäufer kontaktieren

Neu kaufen

EUR 168,32
Währung umrechnen
Versand: EUR 5,85
Von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & Dauer

Anzahl: Mehr als 20 verfügbar

In den Warenkorb