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Force Sensors for Microelectronic Packaging Applications (Microtechnology and MEMS) - Softcover

 
9783642060632: Force Sensors for Microelectronic Packaging Applications (Microtechnology and MEMS)

Inhaltsangabe

Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.

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This monograph is intended for wire bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors. New measurement technologies are introduced that allow in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here enables measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.

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  • VerlagSpringer
  • Erscheinungsdatum2010
  • ISBN 10 3642060633
  • ISBN 13 9783642060632
  • EinbandTapa blanda
  • SpracheEnglisch
  • Anzahl der Seiten188
  • Kontakt zum HerstellerNicht verfügbar

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9783540221876: Force Sensors for Microelectronic Packaging Applications (Microtechnology and MEMS)

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ISBN 10:  3540221875 ISBN 13:  9783540221876
Verlag: Springer, 2004
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Jürg Schwizer
ISBN 10: 3642060633 ISBN 13: 9783642060632
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Taschenbuch. Zustand: Neu. Neuware -Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch. Artikel-Nr. 9783642060632

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ISBN 10: 3642060633 ISBN 13: 9783642060632
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Intended for wire-bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors, this practical monograph introduces novel measurement technologies that allow for in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here makes possible measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire-bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding and future development of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are also illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging. Artikel-Nr. 9783642060632

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Schwizer, Jürg; Mayer, Michael; Brand, Oliver
Verlag: Springer, 2010
ISBN 10: 3642060633 ISBN 13: 9783642060632
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