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Noncontact Atomic Force Microscopy (NanoScience and Technology) - Hardcover

 
9783540431176: Noncontact Atomic Force Microscopy (NanoScience and Technology)
Hardcover
ISBN 10: 3540431179 ISBN 13: 9783540431176
Verlag: Springer, 2002

Inhaltsangabe

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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Verlag
Springer
Erscheinungsdatum
2002
Sprache
Englisch
ISBN 10 
3540431179
ISBN 13 
9783540431176
Einband
Gebundene Ausgabe
Anzahl der Seiten
458
Herausgeber
Morita S., Wiesendanger Roland, Meyer E.
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