Atom Probe Microscopy - Softcover

Inhaltsangabe

Preface
Acknowledgements
List of Acronyms and Abbreviations
List of Terms
List of Non-SI Units and Constant Values

PART I Fundamentals

1. Introduction

2. Field Ion Microscopy
2.1 Principles
2.1.1 Theory of field ionisation
2.1.2 'Seeing' atoms - field ion microscopy
2.1.3 Spatial resolution of the FIM
2.2 Instrumentation and Techniques for FIM
2.2.1 FIM instrumentation
2.2.2 eFIM or digital FIM
2.2.3 Tomographic FIM Techniques
2.3 Interpretation of FIM Images
2.3.1 Interpretation of the image in a pure material
2.3.2 Interpretation of the image for alloys
2.3.3 Selected applications of the FIM
2.3.4 Summary

3 From Field Desorption Microscopy to Atom Probe Tomography
3.1 Principles
3.1.1 Theory of field evaporation
3.1.2 'Analysing' atoms one-by-one: atom probe tomography
3.2 Instrumentation and Techniques for APT
3.2.1 Experimental setup
3.2.2 Field desorption microscopy
3.2.3 High voltage pulsing techniques
3.2.4 Laser pulsing techniques
3.2.5 Energy compensation techniques

Part II Practical aspects

4. Specimen Preparation
4.1 Introduction
4.1.1 Sampling issues in microscopy for materials science and engineering
4.1.2 Specimen requirements
4.2 Polishing methods
4.2.1 The electropolishing process
4.2.2 Chemical polishing
4.2.3 Safety Considerations
4.2.4 Advantages and limitations
4.3 Broad ion beam techniques
4.4 Focused ion beam techniques
4.4.1 Cut-away methods
4.4.2 Lift-out methods
4.4.3 The final stages of FIB preparation
4.4.4 Understanding and minimising ion beam damage and other artefacts
4.5 Deposition methods
4.6 Methods for organic materials
4.6.1 Polymer microtips
4.6.2 Self-assembled monolayers
4.6.3 Cryopreparation
4.7 Other Methods
4.7.1 Dipping
4.7.2 Direct growth of suitable structures
4.8 Specimen geometry issues
4.8.1 Influence of specimen geometry on atom probe data
4.8.2 Stress states and specimen rupture
4.9 A guide to selecting an appropriate specimen preparation method

5. Experimental protocols in Field Ion Microscopy
5.1 Step-by-step procedures for FIM
5.2 Operational space of the field ion microscope
5.2.1 Imaging gas
5.2.2 Temperature
5.2.3 The best image field
5.2.4 Other parameters
5.2.5 Summary

6. Experimental protocols
6.1 Specimen alignment
6.2 Aspects of mass spectrometry
6.2.1 Detection of the ions
6.2.2 Mass spectra
6.2.3 Formation of the mass spectrum
6.2.4 Mass resolution
6.2.5 Common artefacts
6.2.6 Elemental identification
6.2.7 Measurement of the composition
6.2.8 Detectability
6.3 Operational space
6.3.1 Flight path
6.3.2 Temperature / Pulse fraction
6.3.3 Selecting the pulsing mode
6.3.4 Pulse rate
6.3.5 Detection rate
6.4 Specimen failure
6.5 Data quality assessment
6.5.1 Field desorption map
6.5.2 Mass spectrum
6.5.3 Multiple events
6.5.4 Discussion

7. Tomographic reconstruction
7.1 Projection of the ions
7.1.1 Estimation of the electric field
7.1.2 Field distribution
7.1.3 Ion trajectories
7.1.4 Point projection
7.1.5 Radial projection with angular compression
7.1.6 Discussion
7.2 Reconstruction
7.2.1 General considerations
7.2.2 Bas et al. protocol
7.2.3 Geiser et al. protocol
7.2.4 Gault et al. protocol
7.2.5 Reflectron-fitted instruments
7.2.6 Summary and discussion
7.3 Calibration of the parameters
7.3.2 Discussion
7.3.3 Limitations of the current procedure
7.4 Common artefacts
7.4.2 Correction of the reconstruction
7.5 Perspectives on the reconstruction in atom probe tomography
7.5.1 Advancing the reconstruction by correlative microscopy
7.5.2 In correlation with simulations
7.5.3 Alternative ways to exploit existing data
7.6 Spatial resolution in APT
7.6.1 Introduction

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