High Quality Test Pattern Generation and Boolean Satisfiability - Hardcover

Eggersglüß, Stephan; Drechsler, Rolf

 
9781441999757: High Quality Test Pattern Generation and Boolean Satisfiability
Hardcover
ISBN 10: 1441999752 ISBN 13: 9781441999757
Verlag: Springer, 2012

Inhaltsangabe

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

 

The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:

 

  • Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT);
  •  Describes a highly fault efficient SAT-based ATPG framework;
  • Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;
  • Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;
  • Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Von der hinteren Coverseite

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:

  • Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT);
  • Describes a highly fault efficient SAT-based ATPG framework;
  • Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly;
  • Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model;
  • Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
1441999752
ISBN 13 
9781441999757
Einband
Gebundene Ausgabe
Anzahl der Seiten
211
Kontakt zum Hersteller
ROXIO
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
22391
Deutschland

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Softcover