Characterization and Measurement of Passive and Active Metamaterial Devices - Softcover

Lundell, Christopher A.

 
9781249594987: Characterization and Measurement of Passive and Active Metamaterial Devices
Softcover
ISBN 10: 1249594987 ISBN 13: 9781249594987
Verlag: LIGHTNING SOURCE INC, 2012

Inhaltsangabe

This document addresses two major obstacles facing metamaterial development: uncertainty in the characterization of electromagnetic field behavior in metamaterial structures and the relatively small operational bandwidth of metamaterial structures. To address the first obstacle, a new method to characterize electromagnetic field behavior in a metamaterial is presented. This new method is a bistatic radar cross section (RCS) measurement technique. RCS measurements are well-suited to measuring bulk metamaterial samples because they show frequency dependence of scattering angles and offer common postprocessing techniques that can be useful for visualizing results.

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Verlag
LIGHTNING SOURCE INC
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
1249594987
ISBN 13 
9781249594987
Einband
Taschenbuch
Anzahl der Seiten
246
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
preigu
mail@preigu.de

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