Test Generation for Very Large Scale Integration Chips - Hardcover

Agrawal, Vishwani D.; Seth, S.C.

 
9780818687860: Test Generation for Very Large Scale Integration Chips
Hardcover
ISBN 10: 081868786X ISBN 13: 9780818687860
Verlag: IEEE Computer Society Press,U.S., 1988

Inhaltsangabe

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.

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Reseña del editor

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
IEEE Computer Society Press,U.S.
Erscheinungsdatum
1988
Sprache
Englisch
ISBN 10 
081868786X
ISBN 13 
9780818687860
Einband
Tapa dura
Anzahl der Seiten
400
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar