Verwandte Artikel zu Semiconductor Material and Device Characterization
Inhaltsangabe
This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Reseña del editor
This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Weitere beliebte Ausgaben desselben Titels
Suchergebnisse für Semiconductor Material and Device Characterization
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Verlag:
Wiley & Sons, Incorporated, John, 1990
ISBN 10: 0471511048
ISBN 13: 9780471511045
Gebraucht
Hardcover
Anbieter: Better World Books, Mishawaka, IN, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages. Artikel-Nr. 7648326-75
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 2.15. Artikel-Nr. G0471511048I4N00
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 2.15. Artikel-Nr. G0471511048I3N00
Anzahl: 1 verfügbar
Foto des Verkäufers
Semiconductor Material and Device Characterization - 1st Edition/1st Printing
Verlag:
John Wiley & Sons, Inc., New York, 1990
ISBN 10: 0471511048
ISBN 13: 9780471511045
Gebraucht
Hardcover
Erstausgabe
Anbieter: Books Tell You Why - ABAA/ILAB, Summerville, SC, USA
Verkäuferbewertung 1 von 5 Sternen
Hardcover. Zustand: Near Fine. Zustand des Schutzumschlags: Near Fine. First Edition; First Printing. A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo. Artikel-Nr. 42841
Anzahl: 1 verfügbar