Semiconductor Material and Device Characterization - Hardcover

Schroder, Dieter K

 
9780471241393: Semiconductor Material and Device Characterization
Hardcover
ISBN 10: 0471241393 ISBN 13: 9780471241393
Verlag: Wiley VCH, 1998

Über die Autorin bzw. den Autor

DIETER K. SCHRODER is Professor in the Department of Electrical Engineering at Arizona State University. A recipient of the ASU College of Engineering Teaching Excellence Award, he is author of Advanced MOS Devices.

Von der hinteren Coverseite

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.

This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are:
* An entirely new chapter on reliability and probe microscopy
* Numerous examples and end-of-chapter problems - new to this edition
* Five hundred illustrations revised for this edition
* Updated bibliography with over 1,200 references
* Easy-to-use text including a real-world mix of units rather than strictly MKS units.

This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.

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Verlag
Wiley VCH
Erscheinungsdatum
1998
Sprache
Englisch
ISBN 10 
0471241393
ISBN 13 
9780471241393
Einband
Gebundene Ausgabe
Auflage
2
Anzahl der Seiten
760
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar

Weitere beliebte Ausgaben desselben Titels

9780471739067: Semiconductor Material and Device Characterization (IEEE Press)

Vorgestellte Ausgabe

ISBN 10:  0471739065 ISBN 13:  9780471739067
Verlag: Wiley-IEEE Press, 2006
Hardcover