Book by Schroder Dieter K
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This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
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Anbieter: Books Tell You Why - ABAA/ILAB, Summerville, SC, USA
Hardcover. Zustand: Near Fine. Zustand des Schutzumschlags: Near Fine. First Edition; First Printing. A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo. Artikel-Nr. 42841
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