Springer edition fourth edition 2018 (1 Ergebnisse)
Verlag:
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
- Hardcover
Anbieter: BooksRun, Philadelphia, PA, USABooksRun
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Gebraucht - Ausreichend
EUR 55,16
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Hardcover. Zustand: Fair. Fourth Edition 2018. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
