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In den WarenkorbZustand: New. In.
Taschenbuch. Zustand: Neu. VLSI Design and Test | 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers | S. Rajaram (u. a.) | Taschenbuch | xviii | Englisch | 2019 | Springer | EAN 9789811359491 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Zustand: New.
Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2019
ISBN 10: 9811359490 ISBN 13: 9789811359491
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In den WarenkorbPaperback. Zustand: Brand New. revised edition. 740 pages. 9.25x6.10x1.61 inches. In Stock.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.