Transmission electron microscopy diffraction (18 Ergebnisse)

Hardcover. Zustand: Good. Cover boards are slightly bowing/bending. Otherwise book is in great condition with minimal/no other wear, crisp pages showing unmarked text/pictures, and intact binding of the text block. A good reading copy.

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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Zustand: Brand New. 272 pages. 9.18x6.12x9.21 inches. In Stock.

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Taschenbuch. Zustand: Neu. Transmission Electron Microscopy | Diffraction, Imaging, and Spectrometry | C. Barry Carter (u. a.) | Taschenbuch | xxxiii | Englisch | 2018 | Springer | EAN 9783319799889 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Hardcover. Zustand: Brand New. 518 pages. 11.00x8.25x1.25 inches. In Stock.

Taschenbuch. Zustand: Neu. Advanced Transmission Electron Microscopy | Imaging and Diffraction in Nanoscience | Jian Min Zuo (u. a.) | Taschenbuch | xxvi | Englisch | 2018 | Springer | EAN 9781493982493 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.…

Zustand: New. In English.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.…

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.…

Taschenbuch. Zustand: Neu. Neuware - Handbook of Transmission Electron Microscopy is a practical and detailed guide to the principles, instruments, methods, and applications of modern TEM. It is written for students, researchers, laboratory scientists, materials engineers, and microscopy professionals who need a clear reference for study, experiment planning, data analysis, and technical reporting. The book begins with electron-specimen interactions, electron optics, microscope architecture, resolution, alignment, and calibration. It then explains specimen preparation for metals, ceramics, semiconductors, powders, thin films, interfaces, polymers, and site-specific FIB samples. Readers will learn how images and diffraction patterns are formed and how to choose suitable methods for a given materials problem. The chapters cover bright-field and dark-field imaging, diffraction contrast, phase contrast, HRTEM, STEM, HAADF imaging, SAED, CBED, nano-beam diffraction, precession electron diffraction, and 4D-STEM. The analytical electron microscopy sections provide clear guidance on: - Energy-dispersive X-ray spectroscopy, including EDS spectra, elemental mapping, peak identification, quantification, and uncertainty- Electron energy-loss spectroscopy, including EELS calibration, low-loss analysis, core-loss edges, ELNES, EFTEM, thickness measurement, and chemical-state interpretation- Electron tomography and three-dimensional reconstruction- Cryo-TEM and low-dose imaging for beam-sensitive materials- In situ and operando TEM for heating, cooling, electrical biasing, mechanical testing, gas-cell work, and liquid-cell studies- Quantitative image analysis, calibration, measurement uncertainty, data integrity, and reproducible workflows>This TEM textbook for materials science also supports work in nanomaterials characterization, microstructure analysis, crystallography, defect analysis, semiconductor research, metallurgy, catalysts, batteries, coatings, and advanced manufacturing materials. The final chapters bring the methods together into complete investigation workflows. They show how to select the right technique, control artefacts, check data quality, interpret results carefully, and prepare professional laboratory reports. Handbook of Transmission Electron Microscopy is suitable for university courses, postgraduate study, laboratory training, independent research, and day-to-day use as a TEM laboratory reference.…

Hardcover. Zustand: Brand New. 272 pages. 9.19x6.13x0.87 inches. In Stock.