protocol test systems (27 Ergebnisse)

Zustand: Good. 378 pp., paperback, ex library, else textually clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Softcover. Zustand: Très bon. Ancien livre de bibliothèque avec équipements. Couverture différente. Edition 1994. Tome 6. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Different cover. Edition 1994. Volume 6. Ammareal gives back up to 15% of this item's net price to charity organizations.

Zustand: New. In.

Zustand: New. In.

Zustand: Good. 310 pp., ex library, else textually clean & tight, softcover. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.

Zustand: Good. 462 pp., hardcover, ex library, else text and binding still clean, tight and bright. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.

Paperback. Zustand: Brand New. 76 pages. 8.66x5.91x0.18 inches. In Stock.

Paperback. Zustand: Brand New. 76 pages. 8.66x5.91x0.18 inches. In Stock.

Zustand: Good. 332 pp., softcov er, ex library, else textually clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.

Taschenbuch. Zustand: Neu. Automated Protocol Data Analysis | Automation at Different Test Levels for Automatic Train Protection Systems | Valentin Shevchenko | Taschenbuch | Englisch | VDM Verlag Dr. Müller | EAN 9783639114751 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Neuware.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 472 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

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Taschenbuch. Zustand: Neu. Protocol Test Systems | 7th workshop 7th IFIP WG 6.1 international workshop on protocol text systems | Tadanori Mizuno (u. a.) | Taschenbuch | IFIP Advances in Information and Communication Technology | x | Englisch | 2013 | Springer | EAN 9781475763102 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.

Gebunden. Zustand: New. Part One. Open issues in conformance test specification. OSI protocol testing system based on user friendly test scenario specification functions. TTCN test case correctness validation. Invited Address 1. Fault coverage of tests based on finite state .

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Zustand: New. In.

Zustand: New. Presents the research results in protocol testing. This book contains the proceedings of the seventh IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS '94), organized by the International Federation for Information Processing and held in Tokyo, Japan in November 1994. Editor(s): Mizuno, Tadanori; Higashino, Teruo; Shiratori, Norio. Series: IFIP Advances in Information and Communication Technology. Num Pages: 358 pages, biography. BIC Classification: PHDS; UTP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 234 x 156 x 20. Weight in Grams: 1500. . 1995. Hardback. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.

Zustand: New. IWPTS 95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS 95 is the eighth of a series of annual meetings sponsored by the IFIP Work.

Gebunden. Zustand: New. IWPTS 95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS 95 is the eighth of a series of annual meetings sponsored by the IFIP Work.

Paperback. Zustand: Brand New. 464 pages. 9.25x6.10x1.06 inches. In Stock.

Zustand: New. These papers from the 1995 International Workshop on Protocol Test Systems present research in the area of architecture and protocols for computer networks. Themes covered include testing methods, test environments, test generation, and algorithms and languages. Editor(s): Cavalli, Ana; Budkowski, Stan. Series: IFIP Advances in Information and Communication Technology. Num Pages: 464 pages, biography. BIC Classification: PHDS; UTP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 25. Weight in Grams: 1830. . 1996. Hardback. . . . . Books ship from the US and Ireland.

Taschenbuch. Zustand: Neu. Neuware - IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to 'Architecture and Protocols for Computer Networks'. The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).

Buch. Zustand: Neu. Neuware - IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to 'Architecture and Protocols for Computer Networks'. The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).