Sprache: Englisch
Verlag: Springer Berlin / Heidelberg, 1998
ISBN 10: 3540645829 ISBN 13: 9783540645825
Anbieter: Better World Books, Mishawaka, IN, USA
Zustand: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, 1998
ISBN 10: 3540645829 ISBN 13: 9783540645825
Anbieter: moluna, Greven, Deutschland
EUR 120,70
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. This two-volume set constitutes the refereed proceedings of the 11th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE-98, held in Benicassim, Castellon, Spain, in June 1998.The two vo.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 162,86
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 1st edition. 887 pages. 9.50x6.25x1.50 inches. In Stock.
Sprache: Englisch
Verlag: Springer, Berlin, Springer, 1998
ISBN 10: 3540645829 ISBN 13: 9783540645825
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Neuware - This two-volume set constitutes the refereed proceedings of the 11th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE-98, held in Benicassim, Castellon, Spain, in June 1998.The two volumes present a total of 187 revised full papers selected from 291 submissions. In accordance with the conference, the books are devoted to new methodologies, knowledge modeling and hybrid techniques. The papers explore applications from virtually all subareas of AI including knowledge-based systems, fuzzyness and uncertainty, formal reasoning, neural information processing, multiagent systems, perception, robotics, natural language processing, machine learning, supervision and control systems, etc.