Sprache: Englisch
Verlag: Wiley & Sons, Incorporated, John, 1989
ISBN 10: 047184893X ISBN 13: 9780471848936
Anbieter: Better World Books: West, Reno, NV, USA
Zustand: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 318,68
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Phatpocket Limited, Waltham Abbey, HERTS, Vereinigtes Königreich
EUR 336,46
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
EUR 454,71
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Editor(s): Ma, T. P.; Dressendorfer, Paul V. Num Pages: 608 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 168 x 37. Weight in Grams: 1006. . 1989. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 462,28
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. annotated edition. 608 pages. 9.75x6.25x1.00 inches. In Stock.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.