Verlag: Cambridge University Press., 2003
ISBN 10: 0521620066 ISBN 13: 9780521620062
Sprache: Englisch
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
18 x 25 cm. 740 pages. HC Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Sprache: Englisch
Anbieter: Prior Books Ltd, Cheltenham, Vereinigtes Königreich
Erstausgabe
EUR 66,39
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Like New. First Edition. In nearly new condition: bright, crisp and clean with strong joints and sharp corners, just slightly shelf-worn. Hence a small publisher 'damaged' stamp at the prelims. Nonetheless not showing any defects. Looks and feels unread. Thus a very nice copy, firm, square and tight, now offered for sale at a very reasonable price.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 200,94
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. illustrated edition. 740 pages. 9.50x6.75x1.50 inches. In Stock.
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Verlag: Cambridge University Press, (2003), Cambridge University Press,, 2003
Anbieter: Expatriate Bookshop of Denmark, Svendborg, Dänemark
Zustand: Minor rubbing. VG. orig.wrappers Minor rubbing. VG. 26x18cm, xxi,718 pp., PAPERBACK Contents: Basic crystallography; Basic quantum mechanics; The transmission electron microscope; Getting started; Dynamical electron scattering in perfect crystals; Two-beam theory in defect-free crystals; Systematic row and zone axis orientations; Defects in crystals; Electron diffraction patterns; Phase contrast microscopy ["This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field" - Publisher's description].