Sprache: Englisch
Verlag: Plenum Publishing Corporation, 1995
ISBN 10: 0306402807 ISBN 13: 9780306402807
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Taschenbuch. Zustand: Neu. Analytical Transmission Electron Microscopy | An Introduction for Operators | Jürgen Thomas (u. a.) | Taschenbuch | xvii | Englisch | 2016 | Springer | EAN 9789401779883 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer Netherlands, Springer Netherlands, 2016
ISBN 10: 9401779880 ISBN 13: 9789401779883
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points.This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.
Sprache: Englisch
Verlag: Springer Netherlands, Springer, 2014
ISBN 10: 9401786003 ISBN 13: 9789401786003
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points.This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.
Sprache: Englisch
Verlag: Springer-Verlag New York Inc., 2013
ISBN 10: 147575583X ISBN 13: 9781475755831
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Sprache: Englisch
Verlag: Springer-Verlag New York Inc., 2013
ISBN 10: 147575583X ISBN 13: 9781475755831
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Zustand: New. The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or w.
Taschenbuch. Zustand: Neu. Introduction to Analytical Electron Microscopy | John Hren | Taschenbuch | xv | Englisch | 2013 | Springer US | EAN 9781475755831 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer US, Springer New York, 2013
ISBN 10: 147575583X ISBN 13: 9781475755831
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM Or was it born earlier with the first analysis of electron loss spectra It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.
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In den WarenkorbPaperback. Zustand: Brand New. 616 pages. 10.10x8.00x1.50 inches. In Stock.
Verlag: Plenum Press,, 1979
Anbieter: Bernhard Kiewel Rare Books, Grünberg, Deutschland
601 Seiten. Hardcover. Ordnungsgemäß aus einer Universitäts-Bibliothek ausgesondert (Stempel, Signatur). Gut erhaltenes Exemplar. Gewicht über 1 kg. Sprache: Englisch Gewicht in Gramm: 1459.