high resolution transmission electron microscopy (8 Ergebnisse)

Hardcover. Zustand: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1600grams, ISBN:0195042751.

Zustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1400grams, ISBN:9780195072624.

Softcover. 645 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. w05744 9780195072624 Sprache: Englisch Gewicht in Gramm: 1100 [First issued as an Oxford University Press paperback, 1992].

xix+645pp. 8vo. Original cloth, a fine copy. First edition, no dustwrapper issued.

Zustand: New. In.

Hardcover. Zustand: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.

Zustand: New. Provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more. Editor(s): Buseck, Peter R.; Cowley, John M.; Eyring, LeRoy. Num Pages: 670 pages, numerous illustrations, diagrams and tables. BIC Classification: PDN. Category: (P) Professional & Vocational. Dimension: 233 x 161 x 46. Weight in Grams: 1162. . 1989. Illustrated. hardcover. . . . . Books ship from the US and Ireland.