hierarchical modeling vlsi circuit testing von bhattacharya debashis hayes john (2 Ergebnisse)

Gebunden. Zustand: New. Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated .

Kluwer, Boston, 1990. X, 159 pages with some graphics, hard cover----former library book in good condition- 460 Gramm.