Verlag: World Scientific Pub Co Inc, 1996
ISBN 10: 9810228813 ISBN 13: 9789810228811
Sprache: Englisch
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 49,33
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 200 pages. 9.00x6.25x0.75 inches. In Stock.
Verlag: World Scientific Publishing Co Pte Ltd, 1996
ISBN 10: 9810228813 ISBN 13: 9789810228811
Sprache: Englisch
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . . Books ship from the US and Ireland.
Verlag: WORLD SCIENTIFIC PUB CO INC, 1996
ISBN 10: 9810228813 ISBN 13: 9789810228811
Sprache: Englisch
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher.