functional design errors digital von chang kai hui (8 Ergebnisse)

Zustand: New. In.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.

Zustand: New. This text covers innovative methods to automate the debugging process throughout the design flow, enabling the production of more reliable electronic devices. It offers many examples and figures to illustrate key concepts and algorithms. Series: Lecture Notes in Electrical Engineering. Num Pages: 224 pages, biography. BIC Classification: TJFC; UGC; UYF. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 324. . 2010. Paperback. . . . . Books ship from the US and Ireland.

Zustand: New. This text covers innovative methods to automate the debugging process throughout the design flow, enabling the production of more reliable electronic devices. It offers many examples and figures to illustrate key concepts and algorithms. Series: Lecture Notes in Electrical Engineering. Num Pages: 224 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 14. Weight in Grams: 498. . 2008. Hardback. . . . . Books ship from the US and Ireland.