Verlag: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Sprache: Englisch
Anbieter: Better World Books, Mishawaka, IN, USA
Zustand: Good. Used book that is in clean, average condition without any missing pages.
Verlag: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Sprache: Englisch
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 6,92
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1500grams, ISBN:9780521819343.
Verlag: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Sprache: Englisch
Anbieter: Prior Books Ltd, Cheltenham, Vereinigtes Königreich
Erstausgabe
EUR 17,58
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Like New. First Edition. Firm, square and tight with sharp corners and sturdy hinges, just showing a few minor rubs and some mild cosmetic wear. Hence a non-text page is stamped 'damaged'. Despite such this book is in nearly new condition. Thus the contents are crisp, fresh and clean. Offered for sale at a very sensible price.
Verlag: Cambridge University Press, 2007
ISBN 10: 0521819342 ISBN 13: 9780521819343
Sprache: Englisch
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Verlag: Cambridge University Press, 2014
ISBN 10: 1107424143 ISBN 13: 9781107424142
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 228,52
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 631 pages. 9.75x7.00x1.25 inches. In Stock.