Digital logic testing simulation von miczo alexander (10 Ergebnisse)
- Hardcover
Anbieter: Anybook.com, Lincoln, Vereinigtes KönigreichAnybook.com
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EUR 22,89
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Zustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750gr…ams, ISBN:0060444444.
- Hardcover
Anbieter: Anybook.com, Lincoln, Vereinigtes KönigreichAnybook.com
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Gebraucht - Schlecht
EUR 22,89
EUR 15,74 VersandVersand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
Zustand: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060…444444.
Verlag: Harper & Row, New York 1985
- Hardcover
- Erstausgabe
Anbieter: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, USABetween the Covers-Rare Books, Inc. ABAA
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EUR 31,10
EUR 4,74 VersandVersand innerhalb von USAAnzahl: 1 verfügbar
Hardcover. Zustand: Fine. First edition. Near fine. Spine darkened just a little.
- Hardcover
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes KönigreichPBShop.store UK
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EUR 180,27
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HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
- Hardcover
Anbieter: Buchpark, Trebbin, , DeutschlandBuchpark
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EUR 93,32
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Zustand: Gut. Zustand: Gut | Seiten: 696 | Sprache: Englisch | Produktart: Bücher | Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to…reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 192,50
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Zustand: New. In.
- Hardcover
Anbieter: Majestic Books, Hounslow, , Vereinigtes KönigreichMajestic Books
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EUR 238,78
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Zustand: New. pp. xxii + 668 Illus.
- Hardcover
Anbieter: Revaluation Books, Exeter, , Vereinigtes KönigreichRevaluation Books
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EUR 282,48
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Hardcover. Zustand: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
- Hardcover
Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore
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EUR 305,79
EUR 9,06 VersandVersand innerhalb von USAAnzahl: Mehr als 20 verfügbar
Zustand: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illust…rations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 261,98
EUR 65,97 VersandVersand von Deutschland nach USAAnzahl: 2 verfügbar
Buch. Zustand: Neu. Neuware - Your road map for meeting today s digital testing challengesToday, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digit…al systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approachUp-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
