Design reliability von raheja dev (14 Ergebnisse)

Hardcover. Zustand: Very Good. 1. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: new.

Zustand: New.

Zustand: New.

Zustand: As New. Unread book in perfect condition.

Zustand: New. In English.

Zustand: New. pp. 336.

Zustand: New. The aim of Design for Reliability (DFR) is to design for zero failures of critical system functions, which results in enormous savings in life cycle costs for producers and users. This practical guide helps readers to understand the best-of-breed methods, technologies, and tools for incorporating reliability into the complex systems design process. Editor(s): Raheja, Dev G.; Gullo, Louis J. Series: Quality and Reliability Engineering Series. Num Pages: 336 pages, Illustrations, charts. BIC Classification: KJMV5; TGPR. Category: (P) Professional & Vocational. Dimension: 236 x 154 x 23. Weight in Grams: 570. . 2012. 1st Edition. Hardcover. . . . .…

Zustand: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.…

Gebunden. Zustand: New. DEV RAHEJA is President of Raheja Consulting, Inc. For over thirty years, he has served clients in numerous industries, including aerospace, medical devices, auto, and consumer products. Raheja is also the coauthor of Assurance Technologies Principles and P.

Hardcover. Zustand: Brand New. 1st edition. 336 pages. 9.25x6.25x0.75 inches. In Stock.

Zustand: New. The aim of Design for Reliability (DFR) is to design for zero failures of critical system functions, which results in enormous savings in life cycle costs for producers and users. This practical guide helps readers to understand the best-of-breed methods, technologies, and tools for incorporating reliability into the complex systems design process. Editor(s): Raheja, Dev G.; Gullo, Louis J. Series: Quality and Reliability Engineering Series. Num Pages: 336 pages, Illustrations, charts. BIC Classification: KJMV5; TGPR. Category: (P) Professional & Vocational. Dimension: 236 x 154 x 23. Weight in Grams: 570. . 2012. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Buch. Zustand: Neu. Neuware - A unique, design-based approach to reliability engineeringDesign for Reliability provides engineers and managers with a range of tools and techniques for incorporating reliability into the design process for complex systems. It clearly explains how to design for zero failure of critical system functions, leading to enormous savings in product life-cycle costs and a dramatic improvement in the ability to compete in global markets.Readers will find a wealth of design practices not covered in typical engineering books, allowing them to think outside the box when developing reliability requirements. They will learn to address high failure rates associated with systems that are not properly designed for reliability, avoiding expensive and time-consuming engineering changes, such as excessive testing, repairs, maintenance, inspection, and logistics.Special features of this book include:\* A unified approach that integrates ideas from computer science and reliability engineering\* Techniques applicable to reliability as well as safety, maintainability, system integration, and logistic engineering\* Chapters on design for extreme environments, developing reliable software, design for trustworthiness, and HALT influence on designDesign for Reliability is a must-have guide for engineers and managers in R&D, product development, reliability engineering, product safety, and quality assurance, as well as anyone who needs to deliver high product performance at a lower cost while minimizing system failure.…