9789400797987 - Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, Band 115) von Krishnaswamy, Smita; Markov, Igor L.; Hayes, J... (3 Ergebnisse)

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Taschenbuch. Zustand: Neu. Design, Analysis and Test of Logic Circuits Under Uncertainty | Smita Krishnaswamy (u. a.) | Taschenbuch | Lecture Notes in Electrical Engineering | xii | Englisch | 2014 | Springer | EAN 9789400797987 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.