9789385046483 - Digital Forensics: Current Trends and Practices von Venkata Udaya Sameer Ruchira Naskar (1 Ergebnisse)

Hardcover. Zustand: New. 1st Edition. Contents: Preface. Part I: Introduction to Digital Forensics: 1. Why Digital Forensics. 2. Most Common Forensic Problems Today. Part II: Forensic Source Camera Identification: 3. Challenges, Solutions and State-of-the-Art. 4. Features based Source Camera Identification. 5. PRNU Correlation Based Forensic Techniques for Source: Camera Identification. 6. Unknown Model Detection in Source Camera Identification. 7. Recent Development: Deep Learning Based Source-Camera Identification. Part III: Region Duplication: A Preliminary yet Precarious Threat to Multimedia Integrity. 8. Introduction to Region Duplication Attack or Copy-Move Forgery in Digital Images. 9. Region Duplication Attack and its Forensic Solutions - State-of-the-Art Research Practices. 10. Image Block Matching based Region Duplication Detection. 11. Addressing Post-Processing Attacks in Copy-Move Forgery Detection. 12. Combining Geometric and Post-Processing Attacks in Copy- Move Forgery. 13. Region Duplication Detection using Image Key-points. Part IV: Digital Forensics in Compressed Multimedia. 14. Double Compression Based Forgery Detection in Images and Videos. 15. Intra and Inter Frame Video Forgery Detection: State-of- the-Art Problems and Solutions. Part V: Counter Forensics: Major Threat to Forensic Technology : 16. Present Day Counter Forensic Challenges. 17. Deep Learning Based Counter Forensics. References. Subject Index. This book presents to the readers the basics of Digital Forensics; why this domain is gaining rapid importance in the present day. We clarify the difference of this domain of research, from traditional security measures; specifically the additional challenges that digital forensic techniques are able to overcome, as compared to the olden techniques of cryptography, watermarking and steganography. In the book, we discuss about the most important challenges faced by forensic analysts in the present day, along with the state-of-the-art solutions. We also present the recent challenges identified in this field, while paving a path for possible future researches towards solving those.