ISBN: 9787502441012 - 半导体测试技术原理与应用 (1 Ergebnisse)

paperback. Zustand: New. Language:Chinese.Publisher: metallurgy Pub. Date :2006-11 -01. The book is 11 chapters. Chapter 1 of the semiconductor micro-resistance measurement techniques are analyzed and compared various methods. the sheet resistance of domestic and international test methods are reviewed; Chapter 2 is a four-probe techniques to measure the sheet resistance analysis of the principle of the conventional straight-line four probe. an improved Vanderbilt Law and oblique style square Rymaszewski four-probe m.…