ISBN: 9783731514022 - retroreflex ellipsometry for nonplanar surfaces (schriftenreihe automatische sichtprüfung und bildverarbeitung, band 24) (2 Ergebnisse)

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.…

Taschenbuch. Zustand: Neu. Retroreflex Ellipsometry for Nonplanar Surfaces | Chia-Wei Chen | Taschenbuch | Englisch | 2025 | Karlsruher Institut für Technologie | EAN 9783731514022 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. …