9783659513619 - design for yield and reliability for nanometer cmos digital circuits: statistical design, soft errors modeling, adaptive body bias, negative capacitance circuits von mostafa, hassan; anis, mohab; elmasry, mohamed (1 Ergebnisse)

Taschenbuch. Zustand: Neu. Design for Yield and Reliability for Nanometer CMOS Digital Circuits | Statistical design, Soft errors modeling, Adaptive body bias, Negative capacitance circuits | Hassan Mostafa (u. a.) | Taschenbuch | 296 S. | Englisch | 2014 | LAP LAMBERT Academic Publishing | EAN 9783659513619 | Verantwortliche Pe…