Sprache: Englisch
Verlag: Springer-Verlag New York Inc, 2012
ISBN 10: 3642285651 ISBN 13: 9783642285653
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 82,91
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. revised edition. 365 pages. 8.80x6.20x1.00 inches. In Stock.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 104,75
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Springer, Springer Spektrum, 2012
ISBN 10: 3642285651 ISBN 13: 9783642285653
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.
Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 368 | Sprache: Englisch | Produktart: Bücher | This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.