ISBN: 9783642098697 - applied scanning probe methods xi: scanning probe microscopy techniques (nanoscience and technology) (3 Ergebnisse)

ISBN: 
Mit der Detailsuche verfeinern

Optimieren Sie Ihre Suche

  • Bücher (3)

bis

Benutzerdefinierte Preisspanne (EUR)

bis

  • Sprache: Englisch

    Verlag: Springer, 2010

    364209869X / 9783642098697

    • Softcover

    Anbieter: Phatpocket Limited, Waltham Abbey, HERTS, Vereinigtes KönigreichPhatpocket Limited

    Verkäufer/-in mit 5 Sternen
    Verkäufer/-in kontaktieren

    Zustand: Gebraucht - Befriedigend

    EUR 94,76

    EUR 12,77 Versand 
    Versand von Vereinigtes Königreich nach USA

    Anzahl: 1 verfügbar

    Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

  • Sprache: Englisch

    Verlag: Springer, 2010

    364209869X / 9783642098697

    • Softcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

    Verkäufer/-in mit 5 Sternen
    Verkäufer/-in kontaktieren

    Zustand: Neu

    EUR 133,20

    EUR 35,00 Versand 
    Versand von Deutschland nach USA

    Anzahl: 1 verfügbar

    Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth.…

  • Sprache: Englisch

    Verlag: Springer, 2010

    364209869X / 9783642098697

    • Softcover

    Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books

    Verkäufer/-in mit 5 Sternen
    Verkäufer/-in kontaktieren

    Zustand: Neu

    EUR 182,26

    EUR 12,00 Versand 
    Versand von Vereinigtes Königreich nach USA

    Anzahl: 1 verfügbar

    Paperback. Zustand: Brand New. 236 pages. 8.90x6.00x0.80 inches. In Stock.