Isbn: 9783642062285 - infrared ellipsometry on semiconductor layer structures: phonons, plasmons, and polaritons (springer tracts in modern physics, band 209) (4 Ergebnisse)

Zustand: New. In English.

Taschenbuch. Zustand: Neu. Infrared Ellipsometry on Semiconductor Layer Structures | Phonons, Plasmons, and Polaritons | Mathias Schubert | Taschenbuch | Springer Tracts in Modern Physics | xi | Englisch | 2010 | Springer | EAN 9783642062285 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Paperback. Zustand: Brand New. 193 pages. 9.30x6.00x0.47 inches. In Stock.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.…