9783540426950 - point defects in semiconductors and insulators: determination of atomic and electronic structure from paramagnetic hyperfine interactions (springer series in materials science, 51, band 51) von spaeth, johann-martin; overhof, harald (3 Ergebnisse)
Sprache: Englisch
Verlag: Springer Berlin Heidelberg 2003
Serie: Springer Series in Materials Science, Buch 79 von 233. Buch 79 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: moluna, Greven, , Deutschlandmoluna
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 180,07
EUR 48,99 VersandVersand von Deutschland nach USAAnzahl: Mehr als 20 verfügbar
Zustand: New.
Sprache: Englisch
Verlag: Springer 2003
Serie: Springer Series in Materials Science, Buch 79 von 233. Buch 79 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 225,35
EUR 13,86 VersandVersand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
Zustand: New. In.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg 2003
Serie: Springer Series in Materials Science, Buch 79 von 233. Buch 79 von 233 - Springer Series in Materials Science
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 213,99
EUR 64,61 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The precedent book with the title 'Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy' ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experim…ental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for 'fundamental' studies in solid state physics. Therefore a more 'pedestrian' access to the meth ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from 'forbidden' transitions as well as on spatial correlations between defects in the so-called 'cross relaxation spectroscopy'. High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.
