Sprache: Englisch
Verlag: London ; Berlin [u.a.] : Springer, 1994
ISBN 10: 3540197532 ISBN 13: 9783540197539
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XV, 335 S. : fig. Gr. 8°. OPb. Condition: front cover with cracks; acceptable. (Formal approaches to computing and information technology) (FACIT).
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In den WarenkorbZustand: New. pp. 356 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of measurement schemes, extending them to object-oriented and subjective measurement. A detailed case study provides a measurement strategy for formal specifications, including Prolog, Z and VDM. The reader will be able to formulate problems in measurable terms, appraise and compare formal specifications, assess and enhance existing measurement practices, and devise measurement schemes for describing objective characteristics and expressing value judgements.